Lecture 5 Fault Modeling :Copyright 2001, Agrawal & Bushnell VLSI Test: Lecture 5 1 Lecture 5 Fault Modeling Why model faults? Some real defects in VLSI and PCB Common fault models Stuck-at faults Single stuck-at faults Fault equivalence Fault dominance and checkpoint theorem Classes of stuck-at faults and multiple faults Transistor faults Summary Review exercise


Why Model Faults? :Copyright 2001, Agrawal & Bushnell VLSI Test: Lecture 5 2 Why Model Faults? I/O function tests inadequate for manufacturing (functionality versus component and interconnect testing) Real defects (often mechanical) too numerous and often not analyzable A fault model identifies targets for testing A fault model makes analysis possible Effectiveness measurable by experiments


Some Real Defects in Chips :Copyright 2001, Agrawal & Bushnell VLSI Test: Lecture 5 3 Some Real Defects in Chips Processing defects Missing contact windows Parasitic transistors Oxide breakdown . . . Material defects Bulk defects (cracks, crystal imperfections) Surface impurities (ion migration) . . . Time-dependent failures Dielectric breakdown Electromigration . . . Packaging failures Contact degradation Seal leaks . . . Ref.: M. J. Howes and D. V. Morgan, Reliability and Degradation - Semiconductor Devices and Circuits, Wiley, 1981.


Observed PCB Defects :Copyright 2001, Agrawal & Bushnell VLSI Test: Lecture 5 4 Observed PCB Defects Defect classes Shorts Opens Missing components Wrong components Reversed components Bent leads Analog specifications Digital logic Performance (timing) Occurrence frequency (%) 51 1 6 13 6 8 5 5 5 Ref.: J. Bateson, In-Circuit Testing, Van Nostrand Reinhold, 1985.


Common Fault Models :Copyright 2001, Agrawal & Bushnell VLSI Test: Lecture 5 5 Common Fault Models Single stuck-at faults Transistor open and short faults Memory faults PLA faults (stuck-at, cross-point, bridging) Functional faults (processors) Delay faults (transition, path) Analog faults For more details of fault models, see M. L. Bushnell and V. D. Agrawal, Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits, Springer, 2000.


Single Stuck-at Fault :Copyright 2001, Agrawal & Bushnell VLSI Test: Lecture 5 6 Single Stuck-at Fault Three properties define a single stuck-at fault Only one line is faulty The faulty line is permanently set to 0 or 1 The fault can be at an input or output of a gate Example: XOR circuit has 12 fault sites ( ) and 24 single stuck-at faults a b c d e f 1 0 g h i 1 s-a-0 j k z 0(1) 1(0) 1 Test vector for h s-a-0 fault Good circuit value Faulty circuit value


Fault Equivalence :Copyright 2001, Agrawal & Bushnell VLSI Test: Lecture 5 7 Fault Equivalence Number of fault sites in a Boolean gate circuit is = #PI + #gates + # (fanout branches) Fault equivalence: Two faults f1 and f2 are equivalent if all tests that detect f1 also detect f2. If faults f1 and f2 are equivalent then the corresponding faulty functions are identical. Fault collapsing: All single faults of a logic circuit can be divided into disjoint equivalence subsets, where all faults in a subset are mutually equivalent. A collapsed fault set contains one fault from each equivalence subset.


Equivalence Rules :Copyright 2001, Agrawal & Bushnell VLSI Test: Lecture 5 8 Equivalence Rules sa0 sa1 sa0 sa1 sa0 sa1 sa0 sa1 sa0 sa1 sa0 sa1 sa0 sa1 sa0 sa1 sa0 sa1 sa0 sa1 sa0 sa1 sa0 sa1 sa0 sa1 sa0 sa1 sa0 sa0 sa1 sa1 sa0 sa0 sa0 sa1 sa1 sa1 AND NAND OR NOR WIRE NOT FANOUT


Equivalence Example :Copyright 2001, Agrawal & Bushnell VLSI Test: Lecture 5 9 Equivalence Example sa0 sa1 sa0 sa1 sa0 sa1 sa0 sa1 sa0 sa1 sa0 sa1 sa0 sa1 sa0 sa1 sa0 sa1 sa0 sa1 sa0 sa1 sa0 sa1 sa0 sa1 sa0 sa1 sa0 sa1 sa0 sa1 Faults in boldface removed by equivalence collapsing 20 Collapse ratio = -- = 0.625 32


Fault Dominance :Copyright 2001, Agrawal & Bushnell VLSI Test: Lecture 5 10 Fault Dominance If all tests of some fault F1 detect another fault F2, then F2 is said to dominate F1. Dominance fault collapsing: If fault F2 dominates F1, then F2 is removed from the fault list. When dominance fault collapsing is used, it is sufficient to consider only the input faults of Boolean gates. See the next example. In a tree circuit (without fanouts) PI faults form a dominance collapsed fault set. If two faults dominate each other then they are equivalent.


Dominance Example :Copyright 2001, Agrawal & Bushnell VLSI Test: Lecture 5 11 Dominance Example s-a-1 F1 001 110 010 000 101 100 011 All tests of F2 Only test of F1 s-a-1 s-a-1 s-a-1 s-a-0 A dominance collapsed fault set


Dominance Example :Copyright 2001, Agrawal & Bushnell VLSI Test: Lecture 5 12 Dominance Example sa0 sa1 sa0 sa1 sa0 sa1 sa0 sa1 sa0 sa1 sa0 sa1 sa0 sa1 sa0 sa1 sa0 sa1 sa0 sa1 sa0 sa1 sa0 sa1 sa0 sa1 sa0 sa1 sa0 sa1 sa0 sa1 Faults in red removed by equivalence collapsing 15 Collapse ratio = -- = 0.47 32 Faults in yellow removed by dominance collapsing


Checkpoints :Copyright 2001, Agrawal & Bushnell VLSI Test: Lecture 5 13 Checkpoints Primary inputs and fanout branches of a combinational circuit are called checkpoints. Checkpoint theorem: A test set that detects all single (multiple) stuck-at faults on all checkpoints of a combinational circuit, also detects all single (multiple) stuck-at faults in that circuit. Total fault sites = 16 Checkpoints ( ) = 10


Classes of Stuck-at Faults :Copyright 2001, Agrawal & Bushnell VLSI Test: Lecture 5 14 Classes of Stuck-at Faults Following classes of single stuck-at faults are identified by fault simulators: Potentially-detectable fault -- Test produces an unknown (X) state at primary output (PO); detection is probabilistic, usually with 50% probability. Initialization fault -- Fault prevents initialization of the faulty circuit; can be detected as a potentially-detectable fault. Hyperactive fault -- Fault induces much internal signal activity without reaching PO. Redundant fault -- No test exists for the fault. Untestable fault -- Test generator is unable to find a test.


Multiple Stuck-at Faults :Copyright 2001, Agrawal & Bushnell VLSI Test: Lecture 5 15 Multiple Stuck-at Faults A multiple stuck-at fault means that any set of lines is stuck-at some combination of (0,1) values. The total number of single and multiple stuck-at faults in a circuit with k single fault sites is 3k-1. A single fault test can fail to detect the target fault if another fault is also present, however, such masking of one fault by another is rare. Statistically, single fault tests cover a very large number of multiple faults.


Transistor (Switch) Faults :Copyright 2001, Agrawal & Bushnell VLSI Test: Lecture 5 16 Transistor (Switch) Faults MOS transistor is considered an ideal switch and two types of faults are modeled: Stuck-open -- a single transistor is permanently stuck in the open state. Stuck-short -- a single transistor is permanently shorted irrespective of its gate voltage. Detection of a stuck-open fault requires two vectors. Detection of a stuck-short fault requires the measurement of quiescent current (IDDQ).


Stuck-Open Example :Copyright 2001, Agrawal & Bushnell VLSI Test: Lecture 5 17 Stuck-Open Example Two-vector s-op test can be constructed by ordering two s-at tests A B VDD C pMOS FETs nMOS FETs Stuck- open 1 0 0 0 0 1(Z) Good circuit states Faulty circuit states Vector 1: test for A s-a-0 (Initialization vector) Vector 2 (test for A s-a-1)


Stuck-Short Example :Copyright 2001, Agrawal & Bushnell VLSI Test: Lecture 5 18 Stuck-Short Example A B VDD C pMOS FETs nMOS FETs Stuck- short 1 0 0 (X) Good circuit state Faulty circuit state Test vector for A s-a-0 IDDQ path in faulty circuit


Summary :Copyright 2001, Agrawal & Bushnell VLSI Test: Lecture 5 19 Summary Fault models are analyzable approximations of defects and are essential for a test methodology. For digital logic single stuck-at fault model offers best advantage of tools and experience. Many other faults (bridging, stuck-open and multiple stuck-at) are largely covered by stuck-at fault tests. Stuck-short and delay faults and technology-dependent faults require special tests. Memory and analog circuits need other specialized fault models and tests.


Review Exercise :Copyright 2001, Agrawal & Bushnell VLSI Test: Lecture 5 20 Review Exercise What are three most common types of blocks a modern SOC is likely to have? Circle three: analog circuit, digital logic, fluidics, memory, MEMS, optics, RF. The cost of a chip is US$1.00 when its yield is 50%. What will be its cost if you increased the yield to 80%. What is the total number of single stuck-at faults, counting both stuck-at-0 and stuck-at-1, in the following circuit?


Answers :Copyright 2001, Agrawal & Bushnell VLSI Test: Lecture 5 21 Answers What are three most common types of blocks a modern SOC is likely to have? Circle three: analog circuit, digital logic, fluidics, memory, MEMS, optics, RF. The cost of a chip is US$1.00 when its yield is 50%. What will be its cost if you increased the yield to 80%. Assume a wafer has n chips, then wafer cost Chip cost = -------- = $1.00 0.5 × n Wafer cost = 0.5n × $1.00 = 50n cents For yield = 0.8, chip cost = wafer cost/(0.8n) = 50n/(0.8n) = 62.5 cents


Answers Continued :Copyright 2001, Agrawal & Bushnell VLSI Test: Lecture 5 22 Answers Continued What is the total number of single stuck-at faults, counting both stuck-at-0 and stuck-at-1, in the following circuit? Counting two faults on each line, Total number of faults = 2 × (#PI + #gates + #fanout branches) = 2 × (2 + 2 + 2) = 12 s-a-0 s-a-1 s-a-0 s-a-1 s-a-0 s-a-1 s-a-0 s-a-1 s-a-0 s-a-1 s-a-0 s-a-1