Secondary Ion Mass Spectrometry (SIMS)

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Secondary Ion Mass Spectrometry (SIMS): 

Secondary Ion Mass Spectrometry (SIMS) Karena Hawkins

Introduction: 

Introduction In a group of analytical methods known as ion spectroscopic techniques Compared to other mass analyzers SIMS is known as the most highly developed method Used in material and surface science SIMS has three analysis methods Static SIMS Dynamic SIMS Imaging SIMS

How Is SIMS Used???: 

How Is SIMS Used??? SIMS is primarily used for two reasons: Composition of organic and inorganic solids at the outer region of a sample Spatial and depth resolutions depending on the method used

How IS SIMS Used Cont.: 

How IS SIMS Used Cont.

Advantages and Disadvantages: 

Advantages and Disadvantages Advantages The analysis consumes very little sample (essentially non-destructive ) High sensitivity Low concentrations can be analyzed Depth profiling Ability to identify all elements Disadvantages Not all elements in all substrates (matrices) can be analyzed quantitatively . Expensive $$$

SIMS Used In Research: 

SIMS Used In Research http:// link.springer.com/article/10.1007/s10967-012-1670-9/fulltext.html The goal of the experiment described in the paper was to prepare samples with thorium content on steel discs by electrodeposition . The experiment used TOF-SIMS which is Time-of-Flight Secondary Ion Mass Spectrometry Stainless steel discs were first counted using a low-level alpha spectrometer Discs were then measured by TOF-SIMS in the positive and negative polarity

Data and Results : 

Data and Results From the mass spectras , the dependence from intensity of some integral and normalized ions on surface weight m p was plotted to give quantitative data. Other data also obtained from the experiment: 2-D distribution of elements and molecules Depth profiling The use of alpha spectrometry and SIMS was used to prove that the presence of oxidized forms of thorium were present in the upper layer of the surface.

References: 

References An Introduction to Secondary Ion Mass Spectroscopy. http://www.minisims.com/docs/introduction_to_sims.pdf . (Accessed 11/17/2012) Mueller , P. Vervoort , J. Geochemical Instrumentation and Analysis. http:// serc.carleton.edu/research_education/geochemsheets/techniques/SIMS.html . ( Accessed 11/16/2012) Kuruc , J.; Harvan , D.’ Galanda D.; Mátel , L.; Jerigová , M.; Velič , D. Alpha Spectrometry and Secondary Ion Mass Spectrometry of Electrodeposited Uranium Films. Journal of Radioanalytical & Nuclear Chemistry. [Online] 2011, 289, 611-615. http:// link.springer.com/article/10.1007/s10967-012-1670-9/fulltext.html (Accessed Oct 9, 2012). Secondary Ion Mass Spectrometery . http:// www.semitracks.com/index.php/reference-material/failure-and-yield-analysis/materials-characterization/sims .(Accessed 11/17/2012)