Atomic Force Microscopy (AFM) image of self-assembled nanostructures :
Atomic Force Microscopy (AFM) image of self-assembled nanostructures Nano-islands of InAs are self-assembled during MBE growth so as to minimize elastic energy due to high lattice-mismatch between substrate and epitaxial deposits
No need of complex nanolithographic techniques
Quantum dots consist of nano-islands capped with suitable semiconductor layers
Due to band discontinuities, carriers are 3D quantum confined and acquire 0D character and properties 100 nm Innovative material
The CNR-IMEM research :
The CNR-IMEM research i) the development of MBE of quantum dot nanostructures
ii) the correlation between preparation conditions and optoelectronic, electric and morphological properties
iii) the engineering of light emission in the spectral windows of optoelectronic interest (0.98 µm, 1.31 µm and 1.55 µm)
The results allowed :
i) the acquisition of technologies for the preparation of 0.98 µm structures, used by a world leader in photonics (Avanex Corporation) to fabricate lasers with interesting properties. This activity has been carried out within the MIUR-CNR
“Nanotechnologies” Project, in cooperation with Avanex
ii) to develop the concept of strain-engineering to tune the emission in the 1.31 and 1.55 µm windows. This activity takes place within the MIUR-FIRB “Nanotechnologies and Nanodevices for the Information Society” Project.
Relevant contributions of:
CNR-IFN, Un. Milano Bicocca, Un. Firenze, Un. Pavia, Un. Roma “La Sapienza”, Politecnico di Torino
Network of excellence of the 6th Framework Program of EU:
Self-Assembled semiconductor Nanostructures for new Devices
in photonics and Electronics (SANDiE)