x ray diff. ppt

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X-ray Diffraction : 

X-ray Diffraction The Basics Followed by a few examples of Data Analysis by Wesley Tennyson NanoLab/NSF NUE/Bumm

X-ray Diffraction : 

NanoLab/NSF NUE/Bumm X-ray Diffraction Bragg’s Law Lattice Constants Laue Conditions θ - 2θ Scan Scherrer’s Formula Data Analysis Examples

Bragg’s Law : 

Bragg’s Law nλ = 2 d sin θ Constructive interference only occurs for certain θ’s correlating to a (hkl) plane, specifically when the path difference is equal to n wavelengths.

Bragg condition’s : 

NanoLab/NSF NUE/Bumm Bragg condition’s The diffraction condition can be written in vector form 2k∙G + G2 = 0 k - is the incident wave vector k’ - is the reflected wave vector G - is a reciprocal lattice vector such that where G = ∆k = k - k’ the diffraction condition is met

Lattice Constants : 

NanoLab/NSF NUE/Bumm Lattice Constants The distance between planes of atoms is d(hkl) = 2π / |G| Since G can be written as G = 2π/a (h*b1+ k*b2 +l*b3) Substitute in G d(hkl) = a / (h2 + k2 + l2)(1/2) Or a = d * (h2 + k2 + l2)(1/2) a is the spacing between nearest neighbors

Laue Conditions : 

NanoLab/NSF NUE/Bumm Laue Conditions a1∙∆k = 2πυ1 a2∙∆k = 2πυ2 a3∙∆k = 2πυ3 Each of the above describes a cone in reciprocal space about the lattice vectors a1, a2, and a3. the υi are integers When a reciprocal lattice point intersects this cone the diffraction condition is met, this is generally called the Ewald sphere.

Summary of Bragg & Laue : 

NanoLab/NSF NUE/Bumm Summary of Bragg & Laue When a diffraction condition is met there can be a reflected X-ray Extra atoms in the basis can suppress reflections Three variables λ, θ, and d λ is known θ is measured in the experiment (2θ) d is calculated From the planes (hkl) a is calculated

θ - 2θ Scan : 

NanoLab/NSF NUE/Bumm θ - 2θ Scan The θ - 2θ scan maintains these angles with the sample, detector and X-ray source Normal to surface Only planes of atoms that share this normal will be seen in the θ - 2θ Scan

θ - 2θ Scan : 

NanoLab/NSF NUE/Bumm θ - 2θ Scan The incident X-rays may reflect in many directions but will only be measured at one location so we will require that: Angle of incidence (θi) = Angle of reflection (θr) This is done by moving the detector twice as fast in θ as the source. So, only where θi = θr is the intensity of the reflect wave (counts of photons) measured.

θ - 2θ Scan : 

NanoLab/NSF NUE/Bumm θ - 2θ Scan

Smaller Crystals Produce Broader XRD Peaks : 

Smaller Crystals Produce Broader XRD Peaks

Scherrer’s Formula : 

t = thickness of crystallite K = constant dependent on crystallite shape (0.89) l = x-ray wavelength B = FWHM (full width at half max) or integral breadth qB = Bragg Angle Scherrer’s Formula

Scherrer’s Formula : 

Scherrer’s Formula What is B? B = (2θ High) – (2θ Low) B is the difference in angles at half max 2θ high Noise 2θ low Peak

When to Use Scherrer’s Formula : 

When to Use Scherrer’s Formula Crystallite size <1000 Å Peak broadening by other factors Causes of broadening Size Strain Instrument If breadth consistent for each peak then assured broadening due to crystallite size K depends on definition of t and B Within 20%-30% accuracy at best Sherrer’s Formula References Corman, D. Scherrer’s Formula: Using XRD to Determine Average Diameter of Nanocrystals.

Data Analysis : 

Data Analysis Plot the data (2θ vs. Counts) Determine the Bragg Angles for the peaks Calculate d and a for each peak Apply Scherrer’s Formula to the peaks

Bragg Example : 

Bragg Example

Bragg Example : 

Bragg Example d = λ / (2 Sin θB) λ = 1.54 Ǻ = 1.54 Ǻ / ( 2 * Sin ( 38.3 / 2 ) ) = 2.35 Ǻ Simple Right!

Scherrer’s Example : 

Scherrer’s Example

Scherrer’s Example : 

Scherrer’s Example t = 0.89*λ / (B Cos θB) λ = 1.54 Ǻ = 0.89*1.54 Ǻ / ( 0.00174 * Cos (98.25/ 2 ) ) = 1200 Ǻ B = (98.3 - 98.2)*π/180 = 0.00174 Simple Right!

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